Metal DfAM eSeries: Metrology and DfAM of lattice structures

Younes Chahid, The University of Huddersfield

With the rise of design for additive manufacturing (DfAM), more efficient and functional designs are being made taking advantage of AM complexity. Since these designs are usually complex enough to not be manufactured using conventional manufacturing methods, they are also complex enough to not be measurable using conventional metrology tools. This presentation gives a general introduction to metrology, where XCT fits in the scope of measurement tools, and finally, ways to design for metrology.

Key takeaways: 

• Metrology and its connection to DfAM
• How does X-ray CT work and applications for AM medical devices?
• How to design for AM and for Metrology